Huhtinen H., Paturi P., Driessche I.V., Backer M., Banerjee S., Rijckaert H., Roo J.D., Bennewitz J., Zele M.V., Billinge S.J., Buysser K.D.
Ключевые слова: HTS, YBCO, nanocomposites, fabrication, doping effect, chemical solution deposition, nucleation, growth rate, thin films, nanoparticles, nanoscaled effects, lattice parameter, critical current, composition, X-ray diffraction, critical caracteristics, Jc/B curves, microstructure, experimental results
Ключевые слова: HTS, YBCO, films epitaxial, substrate single crystal, chemical solution deposition, buffer layers, gradient, X-ray diffraction, temperature dependence, fabrication, microstructure, critical caracteristics, Jc/B curves, pinning force, resistive transition, resistivity, experimental results
Petrisor T., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Rubanov S., Armenio A.A., Pinto V.
Petrisor T., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Pinto V., Piperno L.
Ключевые слова: HTS, coated conductors, YBCO, substrate Ni-Cu, substrate Ni-W, substrate Ni-W-Cu, buffer layers, fabrication, PLD process, chemical solution deposition, electron beam evaporation, microstructure, heat treatment, annealing process, grain boundaries, films epitaxial, X-ray diffraction, experimental results
Ключевые слова: HTS, YBCO, fabrication, chemical solution deposition, new
Chen Y., Song Y., Li L., Bian W., Li N., Wang A., Qu W., Yerramilli A.S., Wu H, Theodore N.D., Alford T.L
Ключевые слова: HTS, YBCO, thin films, fabrication, chemical solution deposition, spin coating process, microstructure, X-ray diffraction
Ключевые слова: HTS, coated conductors, buffer layers, fabrication, chemical solution deposition, substrate Ni-W, texture, microstructure, measurement technique
Ключевые слова: HTS, GdBCO, coated conductors, substrate Ni-W, chemical solution deposition, surface, defects, buffer layers, films epitaxial, precursors, X-ray diffraction, microstructure, aging, fabrication
Driessche I.V., Backer M., Pollefeyt G., Rijckaert H., Keukeleere K.D., Roo J.D., Roeleveld K., Bennewitz J., Lynen F.
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